Biography
Dr. Margie P. Olbinado joined the X-ray Tomography Group in March 2019 as Scientist and Industrial Liaison. She designs and carries out tailor-made imaging solutions at the TOMCAT beamline to help industrial partners better understand a product, characterize pre-cursor materials, investigate failure, etc. She works in close collaboration with the PSI Technology Transfer, ANAXAM - Analytics for Advanced Manufacturing, and SLS TT AG. She is an expert on X-ray phase-contrast imaging and tomography, time-resolved X-ray tomography, single-bunch synchrotron imaging, and X-ray grating interferometry. Recently, she is interested in developing X-ray ghost imaging for practical applications. From 2015 to 2019, Dr. Olbinado was a Post-Doc and then a Junior Scientist at The European Synchrotron - ESRF in France, where she co-established the MHz frame-rate imaging capability at beamline ID19. From 2013 to 2015, she was a Post-Doc at Tohoku University in Japan, where she designed grating-based X-ray phase contrast imaging set-ups for compact laser-based X-ray sources. From 2010 to 2013, she obtained her PhD degree at he University of Tokyo in Japan, where she developed stroboscopic X-ray Talbot interferometry at the Photon Factory in Japan. Dr. Olbinado completed BS and MS Physics at the University of the Philippines.
Selected Publications
X-ray phase-contrast ghost imaging using a single-pixel camera, M. P. Olbinado, D. Paganin, Y. Cheng, A. Rack, Optica 8(12), 1538-1544 (2021).
X-ray phase tomography with near-field speckles for three-dimensional virtual histology, M.-C. Zdora, P. Thibault, W. Kuo, V. Fernandez, H. Deyhle, J. Vila-Comamala, M. P. Olbinado, A. Rack, P. Lackie, O. Katsamenis, M. Lawson, V. Kurtcuoglu, C. Rau, F. Pfeiffer, I. Zanette, Optica 7 (9), 1221-1227 (2020).
Megahertz X-ray microscopy at X-ray Free-Electron Laser and Synchrotron sources, P. Vagovic, T. Sato, L. Mikes, G. Mills, R. Graceffa, F. Mattsson, P. Villanueva-Perez, A. Ershov, T. Farago, J. Ulicny, H. Kirkwood, R. Letrun, R. Mokso, M.-C. Zdora, M. P. Olbinado, A. Rack, T. Baumbach, J. Schulz, A. Meents, H.N. Chapman, A. P. Mancuso, Optica 6(9), 1106-1109 (2019).