The SIM beamline produces a high flux of soft x-rays with variable polarization from two independent Apple II type undulator sources. The beamline has one permanent endstation and further downstream an open port for attaching user endstations is available, which can either be operated with a focused or unfocused x-ray beam.
A fast shutter is available, which can be operated at frequencies up to 100 Hz. The open port is equipped with an I0 monitor chamber system, a differential pumping stage and is protected by a fast closing valve, which enables one to perform experiments at near ambient pressure.
Information about fast synchronous operation of the undulators and the monochromator ("On-the-flight" mode) for spectroscopy measurements is available here.
A fast shutter is available, which can be operated at frequencies up to 100 Hz. The open port is equipped with an I0 monitor chamber system, a differential pumping stage and is protected by a fast closing valve, which enables one to perform experiments at near ambient pressure.
Information about fast synchronous operation of the undulators and the monochromator ("On-the-flight" mode) for spectroscopy measurements is available here.
| Insertion devices | Two elliptical twin undulators UE56 |
|---|---|
| Energy range | 90 - 2000 eV |
| Photon flux (1 keV) | 1 x 1015 photons/s/0.1%BW/0.4 A |
| Optics | Plane grating monochromator |
| Photon energy resolution (E/ΔE) | > 5'000 |
| Spot size on sample | 30 µm x 100 µm (V x H) |
Figure 1: Schematic layout of the SIM beamline showing the main components.
Figure 2: Technical drawing of the SIM beamline.