Super-Resolution X-ray Microscopy unveils the buried secrets of the nanoworld

A novel super-resolution X-ray microscope developed by a team of researchers from the Paul Scherrer Institut (PSI) and EPFL in Switzerland combines the high penetration power of x-rays with high spatial resolution, making it possible for the first time to shed light on the detailed interior composition of semiconductor devices and cellular structures. The first super-resolution images from this novel microscope will be published online July 18, 2008 in the journal Science. “Researchers have been working on such super-resolution microscopy concepts for electrons and x-rays for many years,” says EPFL Professor and team leader Franz Pfeiffer. “Only the construction of a dedicated multi-million Swiss-franc instrument at PSI's Swiss Light Source allowed us to achieve the stability that is necessary to implement our novel method in practice.”

Read full article