A Miniaturized Biaxial Deformation Rig for in situ Mechanical Testing

A unique miniaturized biaxial deformation rig was developed, that allows applying in-plane biaxial stress states and to perform strain path changes. The rig can be mounted inside conventional scanning electron microscope chambers and at synchrotron beam lines. The cruciform shaped sample geometry has been optimized with the aid of finite element simulations and allows reaching reasonable levels of plasticity. Sample preparation is challenging and requires the use of advanced preparation techniques. A proof-of-principle in situ X-ray diffraction experiment revealed that the developed rig operates successfully. This will allow obtaining crucial microstructural information in real-time while the samples are subjected to complex biaxial strain paths.