Von Hamos spectrometer for tender energies open to users

A new compact von Hamos spectrometer for tender x-rays (current energy range 2.25-4.5 keV), is now available for emission spectroscopy. This spectrometer allows analyzing the energetic composition of fluorescent light from the sample. It provides research opportunities for emission spectroscopy, and RIXS on the K (P-Sc), L (Zr-Cs) and M (Ir-Fr) absorption edges. It is a compact instrument, with a crystal radius of 7 cm. As detector the MOENCH detector, as PSI internal development, is used. If used with a microfocussed beam an energy resolution of better that 0.5 eV can be achieved. Most importantly, the spectrometer is completely integrated into the x-ray scanning microscope, and hence can be coupled to routine imaging applications. To use the spectrometer please contact the beamline scientist (thomas.huthwelker@psi.ch).