Ultra-short X-ray laser pulses precisely surveyed for the first time

Simon Rutishauser assembles phase and absorption gratings into the grating interferometer structure (Photo: PSI/M. Fischer)
X-ray lasers belong to a modern generation of light sources from which scientists in widely different disciplines expect to obtain new knowledge about the structure and function of materials at the atomic level. On the basis of this new knowledge, it could then be possible one day to develop better medicines, more powerful computers or more efficient catalysts for energy transformation. The scientific value of an X-ray laser stands or falls on the quality of the ultra-short X-ray pulses it produces and which researchers use to illuminate their samples. An international team led by scientists from the Paul Scherer Institute, PSI, has now precisely measured these pulses. In so doing, they have laid the foundation for a scientifically optimal utilisation of X-ray lasers – not least, of the planned SwissFEL at PSI. The results of this work have recently been published in the scientific journal Nature Communications.

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Reference
Exploring the wavefront of hard X-ray free electron laser radiation
Simon Rutishauser, Liubov Samoylova, Jacek Krzywinski, Oliver Bunk, Jan Grünert, Harald Sinn, Marco Cammarata, David M. Fritz, Christian David
Nature Communications: DOI: doi:10.1038/ncomms1950
Contact
Simon Rutishauser, Laboratory for Micro- and Nanotechnology
Paul Scherrer Institute, 5232 Villigen, Switzerland;
Telephone: +41 56 310 25 02, E-Mail: simon.rutishauser@psi.ch

Dr. Christian David, Group Leader X-ray optics and applications
Laboratory for Micro- and Technology
Paul Scherrer Institute, 5232 Villigen, Switzerland;
Telephone: +41 56 310 37 53, E-Mail: christian.david@psi.ch