More information on the device can be found here:
The Use of Laue Microdiffraction to Study Small-scale Plasticity
H Van Swygenhoven, S Van Petegem
JOM 62, 36 (2010).
Technical details
Displacement | ||
---|---|---|
Maximum displacement | 5000nm | |
Force | ||
Method | Transducer | |
Maximum force | 10mN | |
Strain measurement | ||
Method | none | |
Other specifications | ||
Deformation modes | Compression | |
Control modes | Displacement, force | |
Temperature | RT | |
Size (L x W x H) | 75mm x 75mm x 200mm | |
Weight | 1kg | |
Compatible SLS beam lines | MicroXAS |