A dedicated miniaturized deformation rig has been built to apply reversible shear and to be compatible with in situ Laue micro-diffraction. It requires a rather complex sample geometry, where a single crystal is locally thinned down to x-ray beam transparency. Details on the sample geometry can be found here. The machine is controlled by an in-house written LabVIEW program. It allows to perform cyclic reverse shear at constant total strain or applied force.
More information on the device can be found here:
Following dislocation patterning during fatigue
Irastorza-Landa A, Van Swygenhoven H, Van Petegem S, Grilli N, Bollhalder A, Brandstetter S, Grolimund D
ACTA MATERIALIA 112, 184 (2016).
DOI: 10.1016/j.actamat.2016.04.011
Following dislocation patterning during fatigue
Irastorza-Landa A, Van Swygenhoven H, Van Petegem S, Grilli N, Bollhalder A, Brandstetter S, Grolimund D
ACTA MATERIALIA 112, 184 (2016).
DOI: 10.1016/j.actamat.2016.04.011
Technical details
Displacement | ||
---|---|---|
Minimum step size | 5nm | |
Maximum speed | 20mm/s | |
Force | ||
Maximum force | 7N | |
Strain measurement | ||
Method | Angular encoder combined with finite element modeling | |
Maximum shear strain | ~1% | |
Resolution | 0.01% | |
Other specifications | ||
Deformation modes | Reverse shear | |
Control modes | Displacement, force | |
Temperature | RT | |
Size (L x W x H) | 200mm x 90mm x 150mm | |
Weight | 1kg | |
Compatible SLS beam lines | MicroXAS |