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AGIPD: Adaptive Gain Integrating Pixel Detector

AGIPD is a charge integrating, hybrid pixel readout ASIC (application specific integrated circuit) with an automatic adaption of the gain to the incoming number of photons.

AGIPD is developed for the European XFEL in a consortium consisting of the University of Bonn, the University of Hamburg, DESY and the PSI [1][2]. Features like single photon resolution, a dynamic range of more than 1x104 x 12.4 keV photons and frame rates of 4.5 Mhz (during bunch trains) make AGIPD an unique detector for the application at the EU-XFEL [3][4][5]. The AGIPD project is still in the development phase, the submission of the first full scale chip AGIPD1.0 is planned for the end of 2012.

There are four different prototype chips (AGIPD0.1 to AGIPD0.4), which have been developed so far (November 2012) (Fig.1). AGIPD0.2 to AGIPD0.4 feature a pixel matrix of 16 x 16 pixels with a pixel size of 200 x 200 µm2 each. These chips were bump bonded to 320 µm thick silicon sensors, which were biased at +120 V. An extensive characterization of the prototype chips has been performed to understand and improve the chips performance. The first full scale chip, AGIPD1.0, will be submitted at the end of 2012.

Specifications of AGIPD [6]
The AGIPD prototype chips (November 2012). (From left to right) AGIPD0.1 to AGIPD0.4
First imaging tests with the AGIPD prototype chips in an X-Ray box. The 'A' was made from copper. (From left to right) AGIPD0.2, AGIPD0.3, AGIPD0.4
(left) Dynamic gain switching measured with a constant current source and variable integration time. As constant current source a light bulb connected to a big battery was used. (right) Noise performance of AGIPD0.4 (Cf,high=60 fF, CDS gain 2) measured with an integration time of 200 ns using fluorescence radiation from Mo (17.5 keV).
(left) Dynamic gain switching measured with a constant current source and variable integration time. As constant current source a light bulb connected to a big battery was used. (right) Noise performance of AGIPD0.4 (Cf,high=60 fF, CDS gain 2) measured with an integration time of 200 ns using fluorescence radiation from Mo (17.5 keV).

[1] M. Altarelli et al., European X-ray Free Electron Laser. Technical Design Report, ISBN 978-3-935702-17-1 (2006)
[2] Th. Tschentscher et al., Layout of the X-Ray Systems at the European XFEL, TECHNICAL NOTE XFEL.EU TN-2011-001 (2011)
[3] B. Henrich et al., The adaptive gain integrating pixel detector AGIPD a detector for the European XFEL, Nucl. Instr. And Meth. A, DOI: 10.1016/j.nima.2010.06.107
[4] X. Shi et al., Challenges in chip design for the AGIPD detector, Nucl. Instr. and Meth. A 624(2) 2010 387-391, DOI:10.1016/j.nima.2010.05.038.
[5] J. Becker et al., The single photon sensitivity of the Adaptive Gain Integrating Pixel Detector, Nucl. Instr. and Meth. A 694, pp. 82-90, DOI:10.1016/j.nima.2012.08.008 (2012)
[6] D. Greiffenberg, The AGIPD detector for the European XFEL, JINST 7 C01103, DOI: 10.1088/1748-0221/7/01/C01103 (2012)
-- Main.DominicGreiffenberg - 19 Dec 2012

 

 

 

 

 

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Person Position Phone Nr. Email
Dr. Dominic Greiffenberg
Scientist
+41 56 310 43 69
dominic.greiffenberg@psi.ch
Dr. Davide Mezza
Chip designer
+41 56 310 45 23
davide.mezza@psi.ch