Dr. Dominic Greiffenberg

Scientist
photo of Dominic Greiffenberg
Telefon
+41 56 310 43 69
Paul Scherrer Institute PSI
Forschungsstrasse 111
5232 Villigen PSI
Switzerland
Digitale Visitenkarte

Biography

Dominic Greiffenberg pursued his studies in physics at the University of Freiburg (Germany) with the focus on the growth of High-Z sensor layers for X-ray detection (Topic of diploma thesis: “Characterization of detector-grade II-VI compound semiconductors”). The PhD was awarded by the University of Freiburg (Germany) and dealt with the characterization of Medipix2 assemblies with CdTe sensor at the synchrotron source ANKA, which is part of the University of Karlsruhe (Germany) . During his PhD studies, he was on research stays at the Czech Technical University in Prague (Czech Republic) and at the University of Canterbury (Christchurch, New Zealand). He joined PSI in 2010 as Postdoc, where he was working on the development of the AGIPD readout chip, which was one of the three dedicated detector projects for the European XFEL in Hamburg (Germany). Since 2013, he is staff scientist at PSI working again on the development of High-Z sensors. Additionally, he is member of the RTSD advisory board since 2017.

Institutional Responsibilities

Dominic is responsible for the program to develop High-Z sensors which are capable of extending the energy range of the detectors to higher photon energies. Moreover, he takes care of the technical aspects and further advancement of the detector hybridization in the group.

Scientific Research

Dominic’s research is focused on the development of High-Z sensors that can seamlessly complement the state-of-the-art silicon sensors in order to increase the quantum efficiency for photon energies above 20 keV. His particular interest is the characterization of various High-Z materials with high-granularity, charge-integrating detectors like JUNGFRAU/MÖNCH that provide spectral information with a high spatial and temporal resolution and which enable detailed studies about the further optimization of the sensors.

Publications

For an extensive overview we kindly refer you to our publication repository: https://www.dora.lib4ri.ch/psi/islandora/search/dominic%20greiffenberg?type=dismax or https://publons.com/researcher/2624453/dominic-greiffenberg

Greiffenberg, D., Andrä, M., Barten, R., Bergamaschi, A., Busca, P., Brückner, M., … Zhang, J. (2019). Characterization of GaAs:Cr sensors using the charge-integrating JUNGFRAU readout chip. Journal of Instrumentation, 14(05), P05020 (17 pp.). https://doi.org/10.1088/1748-0221/14/05/P05020

Allahgholi, A., Becker, J., Delfs, A., Dinapoli, R., Goettlicher, P., Greiffenberg, D., … Graafsma, H. (2019). The adaptive gain integrating pixel detector at the European XFEL. Journal of Synchrotron Radiation, 26(1), 74-82. https://doi.org/10.1107/S1600577518016077

Mezza, D., Allahgholi, A., Becker, J., Delfs, A., Dinapoli, R., Goettlicher, P., … Zimmer, M. (2019). Characterization of the AGIPD1.1 readout chip and improvements with respect to AGIPD1.0. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 945, 162606 (11 pp.). https://doi.org/10.1016/j.nima.2019.162606
 
Wiedorn, M. O., Oberthür, D., Bean, R., Schubert, R., Werner, N., Abbey, B., … Barty, A. (2018). Megahertz serial crystallography. Nature Communications, 9(1), 4025 (11 pp.). https://doi.org/10.1038/s41467-018-06156-7
 
Ruat, M., Andrä, M., Bergamaschi, A., Barten, R., Brückner, M., Dinapoli, R., … Zhang, J. (2018). Photon counting microstrip X-ray detectors with GaAs sensors. Journal of Instrumentation, 13(1), C01046 (9 pp.). https://doi.org/10.1088/1748-0221/13/01/C01046